Robert Boschgmbh

Felix Wewers

Reiner Krapf

Ulli Hoffmann

Michael Mahler

Uwe Skultety-Betz

Bjoern Haase

Christoph Wieland

Chirstoph Wieland

The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal () in the gigahertz frequency range emitted using a high-frequency transmitter () penetrates the material () to be investigated at least once and is detected by a high-frequency receiver (). According to the present invention, it is provided that the thickness (d) of the material () is measured via at least two transit-time measurements of the measurement signal () performed at various positions () of the high-frequency transmitter () and/or the high-frequency receiver (). The present invention also relates to a device system () for carrying out the method described above.

Method and device for determining the thickness of material using high frequency

The invention relates to a method for the material-penetrative localization of a measurement signal, in particular a material-penetrative positioning method for use on walls, ceilings, and floors. According to the invention, a high-frequency transmitter () emits a measurement signal () in the gigahertz frequency range, which penetrates the material () at least once and is detected by a high-frequency receiver () in order to locate the penetration position (). The invention also relates to a device for carrying out the method.

Method and device for a material-penetrative localization of a measurement signal

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Leverkusen, Germany

Felix Wewers