Carl Zeiss Microimaging Gmbh

Carl Zeiss Jena Gmbh

Carl Zeiss Spectroscopy Gmbh

Car Zeiss Jena Gmbh

Felix Kerstan

Nico Correns

Ullrich Klarner

Werner Hoyme

Manfred Fritsch

Jens Hofmann

Michael Barth

Lutz Freytag

Torsten Büttner

Joerg Margraf

Ulrich Zeh

Doris Jochmann

Carsten Ziener

Gregor Tumpach

Clemens Michael Bier

Gerhard Foerschler

Juergen Gobel

Jurgen Gobel

Jürgen Gobel

In accordance with a method for calibrating structurally identical spectrometers for constituent analysis, a multiplicity of samples are provided and concentrations of one constituent in the individual samples are measured using a reference measuring method. Spectra of the individual samples are measured using one spectrometer selected from the structurally identical spectrometers to determine a preliminary regression model. At least one spectrum is selected from the measured spectra and/or a mean value spectrum formed from the measured spectra. A multiplicity of error spectra are generated using a mathematical model of the structurally identical spectrometers. The individual error spectra are added in each case to the individual selected spectra to obtain simulated spectra. As a result, a resultant regression model is determined in which amplitude values of the measured spectra and selected simulated spectra form the independent variables and in which the reference measurement values form the dependent variable.

Plurality of structurally identical spectrometers and a calibration method therefor

A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Spectrometer system and method for testing of same

The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Spectrometric measurement system and method for compensating for veiling glare

A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Spectrometer with a slit for incident light and fabrication of the slit

The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.

Grating spectrometer system and method for the acquisition of measured values

The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant. With the arrangement according to the invention, the cross-influence of the environment on the detector can be compensated so that the stabilization of the detector temperature is improved. Improved stabilization of the detector temperature is ensured by the additional component of ambient temperature.

Arrangement and method for compensation of the temperature dependency of detectors in spectrometers

The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.

Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics

The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support. Due to its compact size and the minimized expenditure on adjustment and assembly for its manufacture, the inventive spectrometer has numerous applications.

Compact spectrometer

In order to provide an arrangement for pressure compensation for optical devices, particularly spectrometers or the like optical devices, for compensating pressure differences caused by changes in temperature and air pressure between the internal pressure and the external pressure at a housing of an optical device enclosing optical units, which arrangement prevents a contamination of optical functional surfaces of the optical units of the optical device and ensures a constant pressure balance between the interior space and the external surroundings of the housing of an optical device with its optical units while economizing on manufacturing costs, it is proposed that the arrangement for pressure compensation comprises at least one pressure compensating element which is constructed on both sides so as to be permeable to air and which is arranged in a housing opening of the housing wall of the optical device enclosing the optical units.

Pressure compensating device for optical apparatus

A gas sample vessel for a gas analyzer comprising a housing enclosing a cylindrical resonator cavity. Two mirrors which limit the resonator cavity are fastened to the housing for coupling in and feeding back the measurement light proceeding from an illumination source. The mirrors are curved concavely at their surfaces facing the housing and the housing is curved convexly at its surfaces facing the mirrors with approximately the same radius of curvature. The centers of curvature lie in the center axis of the resonator cavity and the mirror surfaces of the mirrors are portions of the concavely curved surfaces facing the housing.

Gas sample vessel for a gas analyzer

A method and a device are disclosed for determining the thickness and growth rate of an ice layer on structural component parts, particularly of aircraft, wherein the thickness and growth rate of an ice layer are determined and displayed in a simple, economical and dependable manner. To this end, a method is disclosed by which the radiation incident on a surface covered by an ice layer or disturbing layer is separated spectrally by a holographic grating connected with a line receiver into enough wavelength regions that a correction of the ice absorption is achieved by comparing the measured radiation with a stored reflection curve of an uncoated surface and by combining the comparison values and determining the peak area in the wavelength region of the ice absorption, and wherein from the thickness of the ice layer and disturbing layer and the ice thickness values obtained in the measurement intervals the growth rate of the ice layer is determined and displayed. The device for carrying out the method comprises a window which is provided in the surface covered by an ice layer or disturbing layer and through which a beam impinges on a holographic grating via an optical imaging system and an entrance slit, is separated by wavelength, imaged on a line receiver and evaluated by a controlling and evaluating unit, and the evaluated data are displayed on a display.

Method and device for determining the thickness and growth rate of an ice layer

An arrangement for fixing an optical component part in position in a device housing, comprising a holder which is connected to a housing and which presses the component part into a cutout in the housing accompanied by pretensioning. The holder is fashioned in one piece from elastic material and is provided with clamps that are formed integral with it, at least one of which clamps presses the component part against a reference plane in direction of one of the coordinates X, Y, Z accompanied by pretensioning, and fastening elements are formed integral with the holder for securing it to the housing.

Growing community of inventors

Jena, Germany

Felix Kerstan