Realtek Semiconductor Inc.

Fei Yan

Dong Qiu

Xiang-Hua Shen

De-Pin Zheng

A method of testing a slave device of an Inter-Integrated Circuit (IC) bus is provided. The method includes the following steps: (A) starting a first read operation or a first write operation of the slave device, the first read operation or the first write operation including a sub-operation of sending a command, an acknowledgement signal, data, an address or a control byte to the slave device; (B) sending a start command or an end command to the slave device after or during the sub-operation; (C) after step (B), performing a second read operation or a second write operation on the slave device; and (D) after step (C), determining whether the second read operation or the second write operation is correctly performed.

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Suzhou, China

Fei Yan