Growing community of inventors

Santa Clara, CA, United States of America

Fei Wang

Average Co-Inventor Count = 4.14

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 6

Fei WangWei Fang (5 patents)Fei WangJack Jau (3 patents)Fei WangKevin Liu (3 patents)Fei WangColin Yong Zou (2 patents)Fei WangKuo-Shih Liu (2 patents)Fei WangChris Zirui Liu (2 patents)Fei WangZhaohui Guo (2 patents)Fei WangXiang Guan (2 patents)Fei WangAlan Zhongjie Wu (2 patents)Fei WangDavid M Signoff (1 patent)Fei WangZhengli Yi (1 patent)Fei WangMorteza Nick (1 patent)Fei WangSong Hu (1 patent)Fei WangKefei Wu (1 patent)Fei WangFei Wang (9 patents)Wei FangWei Fang (64 patents)Jack JauJack Jau (52 patents)Kevin LiuKevin Liu (3 patents)Colin Yong ZouColin Yong Zou (33 patents)Kuo-Shih LiuKuo-Shih Liu (6 patents)Chris Zirui LiuChris Zirui Liu (6 patents)Zhaohui GuoZhaohui Guo (5 patents)Xiang GuanXiang Guan (5 patents)Alan Zhongjie WuAlan Zhongjie Wu (3 patents)David M SignoffDavid M Signoff (31 patents)Zhengli YiZhengli Yi (6 patents)Morteza NickMorteza Nick (6 patents)Song HuSong Hu (4 patents)Kefei WuKefei Wu (3 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Asml Netherlands B.v. (4 from 4,883 patents)

2. Apple Inc. (2 from 40,816 patents)

3. Emc IP Holding Company LLC (2 from 7,353 patents)

4. Hermes Microvision Inc. (1 from 160 patents)


9 patents:

1. 12482915 - Transformer based series Doherty power amplifier

2. 12348125 - Charge pump-enabled circuit protection switch

3. 11720030 - Low dose charged particle metrology system

4. 11175590 - Low dose charged particle metrology system

5. 11043356 - Local alignment point calibration method in die inspection

6. 10585770 - Method and apparatus for accelerating data reconstruction for a disk array

7. 10497538 - Local alignment point calibration method in die inspection

8. 9953803 - Local alignment point calibration method in die inspection

9. 9798471 - Performance of de-clustered disk array by disk grouping based on I/O statistics

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idiyas.com
as of
12/8/2025
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