Syntest Technologies, Inc.

Springsoft, Inc.

Fei-Sheng Hsu

Xiaoqing Wen

Shih-Chia Kao

Hsin-Po Wang

Shyh-Horng Lin

Augusli Kifli

Meng-Chyi Lin

Laung-Terng Wang

Laung-Terng (l-t) Wang

Chi-Chan Hsu

Shianling Wu

Sweyyan Shei

Khader S Abdel-Hafez

Boryau (Jack) Sheu

Ming-Tung Chang

Shun-Miin (Sam) Wang

Laung-Terng (l -t) Wang

Hsin-P Wang

Laung-Terng (l T) Wang

A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).

Computer-aided design system to automate scan synthesis at register-transfer level

A circuit emulator includes emulation resources programmed to emulate a circuit, a clocking system for clocking logic implemented by the emulation resources, a resource interface circuit, a logic analyzer, and a debugger. The resource interface circuit supplies input signals to the emulation resources, stores data representing behavior of signals generated by the emulation resources produces in response to the input signals and configures operating characteristics of the clocking system. Upon detecting a specified event in the selected signals of the emulation resources, the logic analyzer asserts a trigger signal telling the clocking system to stop clocking the emulation resources. Communicating with the resource interface circuit and the logic analyzer via a packet routing network, the debugger acquires and processes the data stored by the resource interface circuit and transmits commands to the resource interface circuit and the logic analyzer specifying clocking system operating characteristics, controlling signal data transfer to the debugger, and defining the signal events the logic analyzer is to detect.

Event-driven emulation system

A method and apparatus for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in a scan-based integrated circuit or circuit assembly in self-test or scan-test mode, where N&#x3e;1 and each domain has a plurality of scan cells. The method and apparatus will apply an ordered sequence of capture clocks to all scan cells within N clock domains where one or more capture clocks must contain one or more shift clock pulses during the capture operation. A computer-aided design (CAD) method is further developed to realize the method and synthesize the apparatus. In order to further improve the circuit's fault coverage, a CAD method and apparatus are further developed to minimize the memory usage and generate scan patterns for full-scan and feed-forward partial-scan designs containing transparent storage cells, asynchronous set/reset signals, tri-state busses, and low-power gated clocks.

Multiple-capture DFT system for scan-based integrated circuits

A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division demultiplexors and time-division multiplexors for shifting stimuli and test responses in and out of high-speed I/O pads in order to reduce test time, test cost, and scan pin count. A synthesis method is also proposed for synthesizing the time-division multiplexors, decompressors, compressors, and time-division multiplexors.

Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit

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Hsinchu, Taiwan

Fei-Sheng Hsu