Sandisk Corporation

Sandisk Technologies Inc.

Farshid Sabet-sharghi

Bahman Qawami

Alan M Chiou

Fabrice Jogand-Coulomb

Robert C Chang

Ron Barzilai

Po Yuan

Mei Yan

Oktay Rasizade

Junzhi Wang

Xian Jun Liu

Chieh-Hao Yang

June Li

Haluk K Tanik

Methods of storing and accessing data using a header portion of a file are disclosed. In an embodiment, a method of storing content in a non-volatile memory is disclosed. The method includes reading a content file including media content and including a trailer, storing information related to the trailer together with secure data in a header portion of a file, and storing the file to a storage element of the non-volatile memory or a memory area of a host device coupled to the non-volatile memory device.

Method of storing and accessing header data from memory

A system and method are disclosed for testing operation of a memory card within an electronic host device. The system includes a flat flexible cable, or strip, for electrically coupling between the memory card slot in a host device and a test assembly. The test assembly may have a card slot for accepting an external memory card, and a debug header for receiving a cable connected to a debug apparatus such as a logic analyzer and/or an oscilloscope.

Method of testing memory card operation

Extender strip and test assembly for testing memory card operation

Growing community of inventors

Los Altos Hills, CA, United States of America

Farshid Sabet-sharghi