Intel Corporation

Farid Rastgar

Sung-Soo Cho

Nikhil Mazumder

Diane M Bryant

In an integrated circuit comprising discrete circuit modules, dedicated test signals for the individual circuit modules are multiplexed with operational signals to the external pins of the integrated circuit. When not in a test mode, the external pins of the chip are coupled to the normal operational signals. When a test mode is commanded, certain external pins are coupled to test signals that are not otherwise available off-chip in accordance with the contents of a test register.

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Farid Rastgar