Corning Intellisense Corporation

Intellisense Corp.

Fariborz Maseeh

An MEOMS sensing chip for optically detecting and measuring substances in fluid samples is disclosed. The MEOMS sensing chip includes a system for optically sensing substances in the fluid samples and a system for delivering the fluid samples to the sensing system. The sensing system includes a two-branch channel waveguide and a plurality of ring waveguides, each branch in the two-branch waveguide being used for evanescently coupling light energy into one of the ring waveguides. The delivering system includes a plurality of micro-channels and a plurality of micro-wells, the micro-channels being used for transporting the fluid samples to the micro-wells. Each micro-well is aligned with a respective ring waveguide and is used for exposing the fluid sample contained therein to the respective ring waveguide. Characteristics related to the evanescent coupling of the light energy into the ring waveguides, e.g., resonant frequencies of the ring waveguides, are used for detecting substances in the fluid samples.

System for high resolution chemical and biological sensing

A knowledge based, computer-aided system and method is disclosed for simulating any set of linear or nonlinear simultaneous parametric dependencies. The preferred embodiment creates a model and provides an estimate of the material properties of materials comprising thin films disposed on semiconductor materials. However the system and method are suitable for creating a model and providing an estimate of the physical properties of materials undergoing other material fabrication processes that are dependent on several parameters. The method is suitable for implementation on exisitng general purpose computers. The method involves the general steps of entering parameter values for the material being subjected to the fabrication process, interrelating the user provided parameter values with a database of stored parameter values, calculating numerical solutions for the interrelated parameter and property values according to an Estimation Routine, and providing an output of numerical and graphical data relating to the desired physical properties. The system is capable of being implemented to include a dual hierarchical feedback and feed-foreward loop where a control system uses the Estimation Routine to determine what additional data acquisition is required. Such a feedback loop could also be employed in conjunction with this method to yield an optimized value for the material properties in question.

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Boston, MA, United States of America

Fariborz Maseeh