Taiwan Semiconductor Manufacturing Comp. Ltd.

Fan-ming Kuo

Wei-Li Chen

Chewn-Pu Jou

Cheng-Hsiang Hsieh

Chaitanya Palusa

Kuang-Kai Yen

Dirk Pfaff

Rob Abbott

Shi-Hung Wang

Rolando Ramirez

Fu-Lung Hsueh

Yung-Hsu Chuang

Tsung-Hsiung Lee

Shih-Hung Lan

Huan-Neng Chen

Hsieh-Hung Hsieh

Yi-Hsuan Liu

Tsung-Hsiung Li

An optimized pulse shaping clock data recovery system is provided that includes a slicer configured to receive a signal and provide an initial set of tentative decisions to a decision feedforward equalizer, where the decision feedforward equalizer provides a fully equalized output signal. The slicer may be incorporated as part of decision feedback equalizer to provide better quality tentative decisions. The clock data recovery system also receives the first output signal that is partially equalized in such a way as to optimally shape it for a clock to sample it at an ideal location by providing an adjustment signal to the analog to digital controller.

SerDes receiver with optimized CDR pulse shaping

Serdes receiver with optimized CDR pulse shaping

The present disclosure relates to a device and method to reduce the dynamic/static power consumption of an MCML logic device. In order to retain register contents during power off mode, an MCML retention latch and flip-flop are disclosed. Retention Latch circuits in MCML architecture are used to retain critical register contents during power off mode, wherein combination logic including clock buffers on the clock tree paths are powered off to reduce dynamic/static power consumption. The MCML retention flip-flop comprises a master latch and a slave latch, wherein a power switch is added to the master latch to power the master latch off during power off mode. The slave latch includes pull-down circuits that remain active to enable the slave latch to retain data at a proper voltage level during power off mode. Other devices and methods are also disclosed.

MCML retention flip-flop/latch for low power applications

A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

Method and apparatus of RFID tag contactless testing

A voltage scaling circuit includes a first critical path and an edge detection unit. The first critical path includes an input and an output. The edge detection unit includes a first input, a second input, a counter and a time-to-digital converter (TDC). The input of the first critical path is electrically connected to the first input of the edge detection unit, and the output of the critical path is electrically connected to the second input of the edge detection unit. The counter is configured to measure a duration between an active edge of a start signal on the first input of the edge detection unit and an active edge of a stop signal on the second input of the edge detection unit in a clock period basis. The TDC is configured to measure a beginning portion and an end portion of the duration.

Method and apparatus of voltage scaling techniques

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Zhubei, Taiwan

Fan-ming Kuo