Koninklijke Philips Corporation N.V.

Fabio De Marco

Thomas Koehler

Andriy Yaroshenko

Lukas Benedict Gromann

Hanns-Ingo Maack

Peter Noel

Konstantin Willer

Peter Benjamin Theodor Nöel

Willer Konstantin

The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector () is arranged opposite an X-ray source () across an examination region () with a grating arrangement () arranged between the X-ray source () and the X-ray detector (). During an imaging operation without an object in the examination region () the grating arrangement () is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector () whilst the X-ray detector () remains stationary relative to the examination region () such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device ('&#x2033;) with less scanning motions.

X-ray imaging reference scan

The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.

Beam hardening correction in x-ray dark-field imaging

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Hamburg, Germany

Fabio De Marco