D-wave Systems Inc.

1372934 B.c. Ltd

Fabio Altomare

Paul I Bunyk

Richard G Harris

Byong Hyop Oh

Eric G Ladizinsky

Jed D Whittaker

Colin C Enderud

Douglas P Stadtler

Nicolas C Ladizinsky

Jason J Yao

Shuiyuan Huang

Edward G Sterpka

Andrew Joseph Berkley

Trevor Michael Lanting

Mark W Johnson

Loren J Swenson

Christopher B Rich

Ilya V Perminov

Byong H Oh

Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.

Systems and methods for fabrication of superconducting integrated circuits

A hybrid processor includes a classical (digital) processor and a quantum processor and implements a calibration procedure to calibrate devices in the quantum processor. Parameter measurements are defined as vertices in a directed acyclic graph. Dependencies between measurements are defined as directed edges between vertices. The calibration procedure orders the vertices, respecting the order of the dependencies while at least attempting to reduce the time needed to perform all the measurements. The calibration procedure provides a level of abstraction to allow non-expert users to use the calibration procedure. Each vertex has a set of attributes defining the status of the measurement, time of the measurement and value of the measurement.

Systems and methods for calibrating devices using directed acyclic graphs

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Vancouver, Canada

Fabio Altomare