Thales

Fabien Kuntz

Christian Sannino

Eric Laurent

Rémi Huynh

Jonathan Sprauel

A method for analyzing dysfunctions of an embedded system including a phase for modeling this system and an analysis phase, the modeling phase including defining a set of resources, a set of services, a set of statuses and at least one rule for the acquisition of a status by a resource or by a service, the analysis phase including configuring the analysis including marking a marked event and analyzing acquisition rules to determine a set of basic events and conditions for the appearance thereof, leading to the appearance of the marked basic event.

Analysis method of embedded system dysfunctions, associated computer program product and analysis device

A method and a device for measuring the performance of a diagnoser of a system under diagnosis, which comprises a knowledge base comprising a set of failures of the system, of effects observed and of relations between failures and effects observed, and an algorithmic core. The method comprises a step of calculating a specific detection rate and a specific location rate for the knowledge base, respectively referred to as expected detection rate and expected location rate. It also comprises a step of calculating a specific detection rate and a specific location rate for the set consisting of knowledge base and algorithmic core, respectively referred to as detection rate obtained and location rate obtained; and a step of calculating the performance of the diagnoser as a function of the expected and obtained detection rates and of the expected and obtained location rates.

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Toulouse, France

Fabien Kuntz