Broker Axs, Inc.

Bruker Axs Se

Bruker Axs Gmbh

Fabian Nitsche

Dominique Porta

System, method and computer program product for determining mass fractions of one or more elements in a test sample based on a measurement with a wave-length dispersive x-ray fluorescence (WDX) spectrometer measuring gross intensities associated with respective elements with to-be-determined mass fractions (MFi) in the test sample. A mass fraction module determines mass fractions (MFi) by using a calibration equation (CE1) with the respective measured gross intensity and a respective calculated scattering efficiency as inputs. The calibration equation (CE1) associates net intensities of characteristic fluorescence lines of the sample elements with respective mass fractions. The net intensity for a particular peak is obtained by subtracting a respective calculated scattering efficiency times a scaling factor from the calibration equation (CE1) from the measured gross intensity of the particular peak. The elemental composition of the test sample is determined either via an iteration module or via an EDX quantification module.

System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers

Techniques for estimating peak intensities in pulse height spectra obtained by a wave-length dispersive x-ray fluorescence spectrometer are disclosed. A pulse height spectrum is obtained from a sample. A model generator generates a pulse height spectrum model by creating a plurality of diffraction order profiles with predefined profile shapes at photon energy positions corresponding to respective diffraction orders of a monochromator of a spectrometer. For each created diffraction order profile where the corresponding photon energy is higher than the edge energy of the detector material of the detector, a respective escape profile is added. A model adjustment module adjusts pulse-height-to-energy-mapping parameters and contribution area of each diffraction order profile ensemble of the pulse height spectrum model using a fitting algorithm. An intensity module provides the contribution area of the first order profile ensemble as the intensity of the energy to be determined by the wavelength-dispersive X-ray fluorescence spectrometer.

System and method for improved measurement of peak intensities in pulse height spectra obtained by wave-length dispersive x-ray fluorescence spectrometers

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Wörth am Rhein, Germany

Fabian Nitsche