Koninklijke Philips Corporation N.V.

Ewald Rössl

Thomas Koehler

Roland Proksa

Rafael Wiemker

Christoph Herrmann

Roger Steadman Booker

Gerhard Martens

Jens Wiegert

Guenter Zeitler

Christian Baeumer

Klaus Jürgen Engel

Ingwer-Curt Carlsen

The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device () for X-ray differential phase-contrast imaging is provided, comprising a deflection structure () with a first plurality () of first areas (), and a second plurality () of second areas (). The first areas are provided to change the phase and/or amplitude of an X-ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses () formed between first areas provided as projections (). The adjacent projections form respective side surfaces () partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance () across the depth () of the recess.

Differential phase-contrast imaging with focussing deflection structure plates

The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to make better use of the X-ray radiation passing the object, a diffraction grating () for X-ray differential phase-contrast imaging is provided with at least one portion () of a first sub-area () and at least one portion () of a second sub-area (). The first sub-area comprises a grating structure () with a plurality of bars () and gaps () being arranged periodically with a first grating pitch P G (), wherein the bars are arranged such that thy change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second sub-area is X-ray transparent and wherein the at least one portion of the second sub-area provides an X-raytransparent aperture () in the grating. Portions of the first and second sub-areas are arranged in an alternating manner in at least one direction ().

Differential phase-contrast imaging

The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating () for X-ray differential phase-contrast imaging, is provided with a first sub-area () comprising at least one portion () of a first grating structure () and at least one portion () of a second grating structure (). The first grating structure comprises a plurality of bars () and gaps () with a first grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars () and gaps () with a second grating orientation G(), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation Gis different than the second grating orientation G. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example.

A method and a device for analyzing a region of interest in an object is proposed. The method comprises: (a) providing measurement data by a differential phase contrast X-ray imaging system, and (b) analyzing characteristics of the object in the region of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises three types of image data spatially aligned with each other, including (i) absorption representing image data A, (ii) differential phase contrast representing image data D, and (iii) coherence representing image data C. The analyzing step is based, for each pixel, on a combination of at least two of information comprised in the absorption representing image data A and information comprised in the differential phase contrast representing image data D and information comprised in the coherence representing image data C.

Method and device for analysing a region of interest in an object using x-rays

In X-ray differential phase-contrast imaging. In order to enhance the information acquired by phase-contrast imaging, an analyzer grating () is provided with an absorption structure (). The latter includes a first plurality () of first areas () with a first X-ray attenuation, and a second plurality () of second areas () with a second X-ray attenuation. The second X-ray attenuation is smaller than the first X-ray attenuation, and the first and second areas are arranged periodically in an alternating manner. A third plurality () of third areas () is provided with a third X-ray attenuation, which lies in a range from the second X-ray attenuation to the first X-ray attenuation, wherein every second of the first or second areas is replaced by one of the third areas.

Differential phase-contrast imaging with increased dynamic range

The invention relates to a detection apparatus comprising a filter () for filtering a conical radiation beam () such that at least a first region () and a second region () of the radiation beam are generated having different energy spectra, wherein the first region of the radiation beam illuminates a first detector area () on a detection surface () of a detector, thereby generating a first set of detection values, and the second region of the radiation beam illuminates a second detector area () on the detection surface, thereby generating a second set of detection values. For example, by using the filter the detection apparatus can be used as dual-energy computed tomography apparatus, wherein, for instance, a standard computed tomography apparatus can be transformed to a dual-energy computed tomography apparatus by adding the filter to the standard computed tomography apparatus, preferentially without modifying the radiation source and the detector.

Detection apparatus

The invention relates to a radiation detector (), particularly an X-ray detector, which comprises at least one sensitive layer () for the conversion of incident photons (X) into electrical signals. A two-dimensional array of electrodes () is located on the front side of the sensitive layer (), while its back side carries a counter-electrode (). The size of the electrodes () may vary in radiation direction (y) for adapting the counting workload of the electrodes. Moreover, the position of the electrodes () with respect to the radiation direction (y) provides information about the energy of the detected photons (X).

Growing community of inventors

Ellerau, Germany

Ewald Rössl