Sony International (Europe) Gmbh

Sony Deutschland Gmbh

Evangelos Zoidis

Markus Kamm

Zoltan Facius

Frederic Ludley

A projector arrangement includes a first image generation and projection unit and a second image generation and projection unit. A first or two-dimensional projection/display mode and a second stereoscopic or projection/display mode can be realized by the cooperating first and second image generation and projection units. The second image generation and projection unit is configured to receive waste light from the first image generation and projection unit and to base the generation of its respective second image on the waste light.

Projector arrangement

An image generation unit with a geometry according to which a light input section and a light output section are formed and/or are arranged such that a light incidence axis or direction and an image emission axis or direction are essentially collinear, parallel, or coincident with respect to each other.

Image generation unit and image projection device

A projector arrangement () is proposed wherein a first, back or illumination part () and a second, front or image projection part () are detachably attachable with respect to each other so as to form a unit at least in an operation mode of said projection arrangement () and to be separable or separated from each other in a non-operation mode of said projection arrangement () and to thereby realize a modular arrangement.

Projection arrangement and electronic customer device

The invention provides a projector arrangement () in which an objective cover unit () for covering a light exit portion or surface () of an objective unit () is adapted to serve as a support or bearing () for a projector unit () of a projector arrangement () in an operation mode. Additionally or alternatively, said projector arrangement () comprises a surface region () to be rested on in an operation or projection mode, so as to realize distinct positions and/or orientations for the projection.

An imaging device is proposed which is adapted for optically imaging an object (O) to be imaged so as to generate object image (OI) and which is adapted for optically projecting a display image (DI) so as to generate a projection image (PI).

Imaging device

The present invention relates to a method for identification of plastic materials of interest by optical measurements, preferably spectroscopic measurements, comprising the steps of measuring a sample and providing a sample spectrum, providing reference spectra for a given group of reference materials of interest, determining spectral distances between sample spectrum and reference spectra, material identification by associating the sample to the material having the reference spectrum with the smallest spectral distance to the sample spectrum. In this method at least one identification frequency range having a high absolute deviation ratio D and/or a high smoothed deviation ratio D&prime; between all pairs of possible plastic materials of interest is determined, and that said spectral distance is only determined within said at least one identification frequency range.

Method and apparatus for identification of plastic materials by optical measurements

Method for identification of plastic materials of interest by spectroscopic measurements, comprising the steps of measuring a sample and providing a sample spectrum; providing reference spectra for a given group of reference materials of interest, determining spectral distances between sample spectrum and reference spectra, material identification by associating the sample to the material having the reference spectrum with the smallest spectral distance to the sample spectrum. In this method a multi-level measurement is conducted, wherein in each level the number of possible materials is further limited. In a first level at least 2 sub-groups and in all levels starting with a second level at least one sub-group of possible materials are defined, wherein one sub-group in the first level comprises all possible materials that are easily distinguishable and at least one further sub-group in the first level comprises materials that are difficult to distinguish from each other. To each sub-group at least one identification frequency range is associated, and said spectral distances are only determined within said at least one identification frequency range in each relevant sub-group of each level and only with respect to reference spectra of materials being comprised in the relevant sub-group.

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Waiblingen, Germany

Evangelos Zoidis