Agilent Technologies, Inc.

Evan R Whitney

David C Chu

A system for sensing an absolute two-dimensional position of an object having a two-dimensional target pattern thereon comprises a sensor and a controller. The sensor is for capturing an image of a subset of the target pattern. The controller is for generating a first image vector representing summations of rows of pixel values from the image, and a second image vector representing summations of columns of pixel values from the image. The controller is configured to determine an absolute two-dimensional position of the subset of the target pattern with respect to the origin of the target pattern based on the first image vector, the second image vector and target vectors that represent the target pattern.

System for sensing an absolute position in two dimensions using a target pattern

A system for sensing an absolute position in two dimensions includes a target having a two-dimensional target pattern. A sensor captures an image of a first subset of the target pattern. A controller generates a first image vector representing summations of rows of pixel values from the image, and a second image vector representing summations of columns of pixel values from the image. The controller is configured to determine an absolute two-dimensional position of the first subset with respect to an origin of the target pattern based on the first and the second image vectors and a plurality of target vectors that represent the target pattern.

Growing community of inventors

Saratoga, CA, United States of America

Evan R Whitney