Intel Corporation

Evan J Halprin

David W Grawrock

Bruce Querbach

Tieyu Zheng

Keshavan K Tiruvallur

Mark B Trobough

Chinna B Prudvi

Hermann Gartler

Vui Yong Liew

Ashok N Kabadi

Samie B Samaan

Keith A Drescher

Jay Joseph Nejedlo

Mukesh Kataria

Lyle E Cool

Russell J Wunderlich

James J Grealish

Brian Meyer

Abhijit Davare

Priyadarsan Patra

William Penner

Ridvan A Sahan

Rahima K Mohammed

Wee Hoo Cheah

Arun R Ramadorai

Kapila B Udawatta

Yuen Tat Lee

John L Baudrexl

Loren James McConnell

Kip C Killpack

Kyle Markley

Christian E Iovin

Sanjay S Salem

Travis K Goff

David C Florey

Jiun Long Foo

Selvakumar Raja Gopal

Neil Dobler

Nagib Z Hakim

Timothy S Storey

Yi Amy Xia

Edwin E Parks

Padmakumar Gopal

An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.

Test, validation, and debug architecture

Growing community of inventors

Hillsboro, OR, United States of America

Evan J Halprin