Samsung Display Co., Ltd.

Samsung Displayco., Ltd.

Eunsol Seo

Taejoon Kim

Jaewoo Choi

Hyun-Wook Cho

Tae-Ho Kim

Hyun-wook Cho

Sangkook Kim

Heonseok Lee

Eungkwan Lee

Jinyoung Jeon

Jun-young Ko

Yujin Sin

An electronic device includes a display unit including an active area configured to display an image, a peripheral area adjacent to the active area, and an input sensing unit disposed on the display unit within the active area. The input sensing unit includes a first sensing electrode disposed in the active area and a second sensing electrode spaced apart from the first sensing electrode and disposed in the active area.

Electronic device

In a method for testing an electronic device, the method includes: providing an electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes; providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes; measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes; and determining whether or not the sensor layer is defective, based on the mutual capacitance.

Electronic device having a testing method for determining defects in a sensor layer

A noise measurement device for measuring noise of a test image displayed on a display device including a display panel and an input sensor configured to sense an external input, includes a luminance meter, a converter, and a determiner. The luminance meter is configured to: measure a luminance of the test image in a state in which the input sensor is turned on to generate first luminance measurement values; and measure a luminance of the test image in a state in which the input sensor is turned off to generate second luminance measurement values. The converter is configured to apply a contrast sensitivity function to luminance difference values between the first and second luminance measurement values to generate final conversion values. The determiner is configured to compare the final conversion values with a predetermined reference range to determine whether a defect exists in the test image.

Noise measuring device and noise measuring method using the same

A communication device includes a first device connected to a data line and a clock line and a second device configured to communicate with the first device via the data line and the clock line. A data signal transmitted to the second device from the first device via the data line swings between a first voltage and a second voltage, the second voltage has a voltage level higher than a voltage level of the first voltage, and a clock signal transmitted to the second device from the first device via the clock line is transited to a third voltage higher than the second voltage at a rising edge and then changed to the second voltage.

Communication device, display device test system using the same, and display device test method using the communication device

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Yongin-si, South Korea

Eunsol Seo