Samsung Electronics Co., Ltd.

Eunhyang Park

Sang-Wan Nam

Jinyoung Kim

Yohan Lee

Sehwan Park

Ji-sang Lee

Sang-Won Park

Ilhan Park

Joonsuc Jang

Se Hwan Park

Jiho Cho

Jisang Lee

Sang-wan Nam

Sang-won Park

A flash memory device includes a memory cell array connected with word lines and control logic that performs threshold voltage compensation on the word lines through a data recover read operation. When a word line on which programming is performed after a selected word line is a dummy word line, the control logic performs the threshold voltage compensation on the selected word line based on a result of a data recover read operation of a word line on which programming is performed before the selected word line. When a next word line on which programming is performed after a selected word line is a dummy word line, the control logic performs threshold voltage compensation on the selected word line based on a result of performing the data recover read operation on a previous word line on which programming is performed before the selected word line.

Flash memory device and data recover read method thereof

Disclosed is an operation method of a memory device that includes a plurality of memory cells stacked in a direction perpendicular to a substrate. The method includes performing first to (n−1)-th program loops on selected memory cells connected to a selected word line from among the plurality of memory cells, based on a first program parameter, and after the (n−1)-th program loop is performed, performing n-th to k-th program loops on the selected memory cells, based on a second program parameter different from the first program parameter. Herein, n is an integer greater than 1 and k is an integer greater than or equal to n. The first and second program parameters include information about at least two of a program voltage increment, a 2-step verify range, and a bit line forcing voltage used in the first to k-th program loops.

Operation method of memory device and operation method of memory system including the same

A reading method for a non-volatile memory device, includes performing a normal read operation using a default read level in response to a first read command; and performing a read operation using a multiple on-chip valley search (OVS) sensing operation in response to a second read command, when read data read in the normal read operation are uncorrectable.

Non-volatile memory device, storage device having the same, and reading method thereof

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Daegu, South Korea

Eunhyang Park