Samsung Display Co., Ltd.

Korea Advanced Institute of Science and Technology

Eunchul Shin

Dae-Sik Lee

Il Ho Lee

Taegon Im

Min-Soo Choi

Sanghyuk Kwon

Hoon Sohn

Minsang Koo

Soonkyu Hwang

Jiho Park

Min-Gyu Kim

Young-Sup Kwon

Sangwoo Choi

Chansik Noh

Woojin Jung

Sangmin Choi

Yeongbin Kim

An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.

Apparatus for inspecting a display panel for defects

A testing device for testing a display module may include touch test pads electrically connected to touch pads of a display module, a first power test pad and a second power test pad electrically connected to a first power pad and a second power pad of the display module, a voltage generator providing a first test power voltage and a second power test voltage to the first power test pad and second power test pad, and a capacitance measurement circuit measuring capacitance between the first power test pad and second power test pad.

Testing device of display module, testing system including the same, and testing method using the same

Growing community of inventors

Cheonan-si, South Korea

Eunchul Shin