Samsung Electronics Co., Ltd.

Eun Seok Shin

Michael Choi

Yong-Woo Kim

Seunghoon Lee

Jung Ho Lee

Jung Hwan Choi

Joo Hwan Kim

Young Don Choi

Jin Do Byun

Hyun-Yoon Cho

Min Kyu Song

Jun Ho Moon

Sun-Jae Park

Junghwan Choi

Kyung Hoon Lee

Minsu Jung

Jindo Byun

Joohwan Kim

Jun Young Park

Su Cheol Lee

Seung Yeob Baek

Kwang Seob Shin

Dai Shi

Disclosed is a memory device which includes a pull-up driver that is connected between a power supply voltage and a first node, a T-coil circuit that is connected between the first node and a second node, an external resistor, and a ZQ controller that performs a ZQ calibration operation on the pull-up driver. The ZQ controller includes a path selecting circuit that selects one node among the first node and the second node, a comparing circuit that compares a voltage of the one node selected by the path selecting circuit with a pull-up reference voltage and outputs a comparison result, and a code generating circuit that generates a pull-up code for driving the pull-up driver, based on the comparison result. While the pull-up code is generated, the external resistor is connected between the second node and a ground voltage.

Memory device, electronic device, and operation method of memory device

A method includes measuring a linearity of a first pull-up circuit, a second pull-up circuit, a third pull-up circuit, a first pull-down circuit, a second pull-down circuit and a third pull-down circuit using an initial pull-up code and an initial pull-down code, each of the first pull-up circuit, the second pull-up circuit and the third pull-up circuit having a respective resistance value determined based on a respective pull-up code, and each of the first pull-down circuit, the second pull-down circuit and the third pull-down circuit having a respective resistance value determined based on a respective pull-down code, and determining a calibration setting indicator based on the measurement result, the calibration setting indicator indicating a calibration method of a transmission driver including the first pull-up circuit, the second pull-up circuit, the third pull-up circuit, the first pull-down circuit, the second pull-down circuit and the third pull-down circuit.

Memory device and method for calibrating the device and fabricating the device

A memory device, a host device and a method of operating the memory device are provided. The memory device includes a data signal generator configured to provide a data signal to a transmission driver, the transmission driver configured to output a multi-level signal having any one of first to third signal levels based on the data signal, a command decoder configured to receive a feedback signal from outside of the memory device and decode the feedback signal, a data signal controller configured to adjust the data signal based on a decoding result of the command decoder, and a drive strength controller configured to adjust at least one of the first to third signal levels based on the decoding result of the command decoder.

Memory device, host device and method of operating the memory device

A bootstrap circuit including: a charge pump; a power unit including a bootstrap capacitor, wherein the bootstrap capacitor is charged using an output voltage of the charge pump; and a switch driver for generating a bootstrap signal based on a clock signal and an analog signal, wherein the analog signal is input to an analog switch, the switch driver for controlling the analog switch using the bootstrap signal, and including a first body switch connected between an input terminal and a body of the analog switch.

Bootstrap circuit and a sampling circuit using the same

A switched capacitor circuit includes a first main sampler circuit, a second main sampler circuit, a first replica sampler circuit, and a second replica sampler circuit. The first main sampler circuit samples a first input of a differential input, and generates a first output corresponding to the sampled first input based on a first reference voltage. The second main sampler circuit samples a second input of the differential input, and generates a second output corresponding to the sampled second input based on a second reference voltage. The first replica sampler circuit receives the first input, and holds the received first input based on the second reference voltage. The second replica sampler circuit receives the second input, and holds the received second input based on the first reference voltage.

Switched capacitor circuit to make amount of change in reference voltage even regardless of input level

A quantizer includes: a quantizer capacitor having a first end and a second end; an input calculator that receives input voltages, sums the input voltages, and outputs the summed result to the first end of the quantizer capacitor; a scaler that receives reference voltages and a scale code, generates a scale voltage from the reference voltages depending on the scale code, and outputs the scale voltage to the second end of the quantizer capacitor; and a latch that stores an output voltage of the first end of the quantizer capacitor.

Quantizer including capacitors and operating method of quantizer

A successive approximation register (SAR) analog-to-digital converter (ADC) includes a ring oscillator configured to determine a frequency based on a sampling clock signal and a first control code, and generate an output clock signal having the determined frequency. The SAR ADC further includes a controller configured to generate the first control code based on a count value indicating a number of times of toggling the output clock signal.

Successive approximation register analog-to-digital converter and semiconductor device including the same

A sample-and-hold circuit including an operational amplifier configured to output a result signal to the ADC; a feedback capacitor connected between an input terminal and an output terminal of the operational amplifier to form a feedback path; a plurality of sampling capacitor blocks each connected to one of a plurality of channels and configured to sample and hold an analog signal input to each of the channels; a plurality of controllers each connected between one of the sampling capacitor blocks and the operational amplifier; and a reset unit connected between a reference voltage source and the input terminal of the operational amplifier to reset the operational amplifier when the operational amplifier does not perform a holding operation. The plurality of controllers configured to switch the sampled signal so that held signals for the respective channels are sequentially input to the operational amplifier.

Multi-channel sample-and-hold circuit and analog-to-digital converter using the same

An analog-to-digital conversion circuit includes a plurality of comparators and an averaging circuit. The averaging circuit is configured so that a length of a metal routing connected between output terminals of two comparators arranged on a leftmost side from among the plurality of comparators or a length of a metal routing connected between output terminals of two comparators arranged on a rightmost side from among the plurality of comparators is less than a length of a metal routing connected between output terminals of two comparators to which reference voltages having levels that are closest in magnitude are input.

Analog-to-digital conversion circuit

An analog-to-digital converter includes a first logic unit and a second logic unit. The first logic unit is configured to receive a plurality of thermometer codes and inverse thermometer codes generated based on an analog signal received by the analog-to-digital converter and to generate a plurality of first digital codes that periodically repeat the same pattern based on a transition position of a logic value in each of the thermometer codes and the inverse thermometer codes. The second logic unit is configured to receive the plurality of first digital codes and to generate a plurality of second digital codes based on logic values of a plurality of bits among all bits of each of the first digital codes.

Growing community of inventors

Seoul, South Korea

Eun Seok Shin