Samsung Electronics Co., Ltd.

Eun-jeong Jang

Chung-ung Kim

Im-ho Shin

An in-vitro diagnostic apparatus includes a loading unit which receives a test medium including a test object; a first clock including first time information that is set as a standard clock time and used to determine whether an expiration date of the test medium has passed; a second clock including second time information that can be set as an arbitrary time; a sensor which acquires the expiration date of the test medium; a controller which determines whether the expiration date of the test medium has passed, based on the first time information; and an analyzer which analyzes the test object based on the second time information when it is determined that the expiration date of the test medium has not yet passed.

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Suwon-si, South Korea

Eun-jeong Jang