Growing community of inventors

Freeport, PA, United States of America

Eugene Pochapsky

Average Co-Inventor Count = 20.00

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 0

Eugene PochapskyNicholas Högasten (1 patent)Eugene PochapskyTheodore R Hoelter (1 patent)Eugene PochapskyKatrin Strandemar (1 patent)Eugene PochapskyPierre M Boulanger (1 patent)Eugene PochapskyAustin A Richards (1 patent)Eugene PochapskyJeremy P Walker (1 patent)Eugene PochapskyGiovanni Lepore (1 patent)Eugene PochapskyJohn C Day (1 patent)Eugene PochapskyLouis Tremblay (1 patent)Eugene PochapskyDylan M Rodriguez (1 patent)Eugene PochapskyJustin Muncaster (1 patent)Eugene PochapskyHugo Hedberg (1 patent)Eugene PochapskyJames Klingshirn (1 patent)Eugene PochapskyKarl Rydqvist (1 patent)Eugene PochapskyFredrik Gihl (1 patent)Eugene PochapskyRasmus Loman (1 patent)Eugene PochapskyRobert Proebstel (1 patent)Eugene PochapskyTien Nguyen (1 patent)Eugene PochapskyEugene Pochapsky (1 patent)Nicholas HögastenNicholas Högasten (87 patents)Theodore R HoelterTheodore R Hoelter (75 patents)Katrin StrandemarKatrin Strandemar (74 patents)Pierre M BoulangerPierre M Boulanger (58 patents)Austin A RichardsAustin A Richards (30 patents)Jeremy P WalkerJeremy P Walker (13 patents)Giovanni LeporeGiovanni Lepore (10 patents)John C DayJohn C Day (4 patents)Louis TremblayLouis Tremblay (4 patents)Dylan M RodriguezDylan M Rodriguez (3 patents)Justin MuncasterJustin Muncaster (2 patents)Hugo HedbergHugo Hedberg (2 patents)James KlingshirnJames Klingshirn (2 patents)Karl RydqvistKarl Rydqvist (1 patent)Fredrik GihlFredrik Gihl (1 patent)Rasmus LomanRasmus Loman (1 patent)Robert ProebstelRobert Proebstel (1 patent)Tien NguyenTien Nguyen (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Teledyne Flir, LLC (1 from 15 patents)


1 patent:

1. 12400452 - Non-contact temperature measurement in thermal imaging systems and methods

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as of
12/26/2025
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