Atmel Corporation

Eugene Jinglun Tam

Geoffrey S Gongwer

Srinivas Ramamurthy

James Fahey

Neal Berger

William J Saiki

A JTAG Boundary Scan method by which the on-chip system logic (OCSL) of an integrated circuit is changed by use of a state machine which, among other functions, allows a predefined set of instructions to be loaded into an Instruction Register and then executed. The predefined instructions are designed to follow in sequence after certain other previous instructions. The instructions change the OCSL from one state to another state and allows the state to be changed without the need of a full device reset. Additional instructions within this invention were created to have attendant operating modes for which termination is self timed within the integrated circuit. Additional instructions further control the implementation of instruction execution within the state machine.

Boundary scan method for terminating or modifying integrated circuit

A boundary scan test circuit (JTAG) interface is used to provide data for a set of configuration latches within a Configuration Register. The Configuration Register is included within the JTAG structure as a Test Data Register (TDR). Each configuration bit within the Configuration Register consists of a Configuration Latch, and each configuration latch has an output used as a configuration control signal within an output logic macrocell. The configuration register's input signal is selectably provided from either a set of serially connected configuration bit non-volatile element sense latches or from the JTAG Test Data In (TDI) data pin for reconfiguration, prototyping, and testing.

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San Jose, CA, United States of America

Eugene Jinglun Tam