E.i. Dupont De Nemours and Company

Sterling Diagnostic Imaging, Inc.

Eugene Francis Palecki

Denny L Lee

William E Wolf

Thomas W Simpson, Iii

Cornell L Williams

Robert H Livermore

David D Dreyfuss

John J Majeski

A process and related apparatus for reducing noise due to addressing and switching the detection elements in a radiation detecting panel comprising an array of detection elements. Noise reduction is achieved in two steps, first by the use of a sample and hold circuit which compares a first signal indicative of switching noise held in a sample and hold circuit with a second signal which includes the switching noise and the desired data signal. The second step includes further reducing noise in the output signal present during readout of the detection elements by comparing the signal from certain elements in the array which have not been exposed to radiation with the signal from the exposed elements in the array to obtain an output with significantly reduced noise.

Method and apparatus for reducing noise in a radiation capture device

An apparatus for optically detecting light-absorbing contamination in at least one particle of low optical-loss material comprises an optical integrating chamber for containing the particles. A laser for emitting a laser beam to illuminate the particles is mounted in the plane of rotation of a rotating mirror such that the laser beam scans in a fan scan. A scanning assembly is mounted in optical alignment with the laser for reflecting the laser beam and for causing the laser beam to scan the particles in the optical integrating chamber. A focusing assembly is mounted in optical alignment with the laser for focusing the scanning laser beam onto the particles in the chamber, the focusing assembly operating in conjunction with the scanning assembly so that light from the laser beam is reflected from the particles and is repeatedly scattered onto the interior walls of the integrating chamber. A light sensing assembly is mounted on the integrating chamber for receiving the repeatedly scattered light from the interior walls of the integrating chamber and for generating a signal indicative of the intensity of the repeatedly scattered light. A decrease in the intensity of the repeatedly scattered light is a function of the presence of light-absorbing contamination in the material.

Apparatus for optically detecting contamination in particles of low

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Wilmington, DE, United States of America

Eugene Francis Palecki