Viavi Solutions Inc.

Eugene Chan

Christopher Russell Wagner

Kevin Cassady

Robert Matthew Adams

Joshua Benjamin Julius Philipson

Luis Andre Neves Paiva Fernandes

Abhilash Sukumari

Nicklos Joseph Bulitka

Christian Richard Comtois-arnaldo

Systems, methods, and devices for providing Köhler illumination for inspection, under a microscope, of end connectors of fiber optic cables. In one aspect, a microscopy system provides Köhler illumination where a numerical aperture of the illumination (NA) is greater than a numerical aperture of imaging (NA). In another aspect, a reflected light microscopy system includes an array of light sources which illuminate a diffuser, which, in turn, projects the diffused light to reflect off of a beamsplitter and through an objective/condenser upon the end connector. In yet another aspect, the array of light sources may provide different light patterns to illuminate the end connector, and each light pattern may correspond to a different type of radiused end connector.

Köhler illumination system for inspection of radiused end connectors

According to examples, a system for measuring polarization dependent loss (PDL) for a device-under-test (DUT) may include a tunable laser, a polarization element and a power meter. The tunable laser may emit an optical signal to sweep across an optical band at a constant rate. The polarization element may scramble polarizations states of the optical signal emitted from the tunable laser. The power meter may take power measurements associated with the optical signal emitted from the tunable laser, wherein the power measurements from the power meter are used to determine a maximum insertion loss (IL) and a minimum insertion loss (IL) associated with the device-under-test (DUT). An average insertion loss (IL) and a polarization dependent loss (PDL) for the device-under-test (DUT) may be calculated based on the maximum insertion loss (IL) and the minimum insertion loss (IL) associated with the device-under-test (DUT).

Techniques for providing a swept wavelength (SW) measurement for acquiring polarization dependent loss (PDL) in a single scan

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Eugene Chan