Jds Uniphase Corporation

Eugene Chan

Chris Wagner

A source generates an optical test signal sweeping a bandwidth of wavelengths over time. The test signal is applied to a device under test (DUT) to generate a response signal. A timing signal generator connected to the source generates a timing signal having triggers at time instances corresponding to known wavelengths of the test signal. A DUT detector samples the DUT response signal generating sampled DUT data using a sampling period that is shorter than a shortest time between timing signal triggers. A correlator receives the timing signal, the known wavelengths associated with the timing signal triggers, the sampled DUT data and the DUT detector sampling period then correlates each sampled DUT datum to a wavelength of the test signal that was applied to the DUT when the DUT datum was sampled by interpolating the known wavelengths using the trigger time instances and the DUT detector sampling period.

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Kanata, Canada

Eugene Chan