Matsushita Electric Industrial Co., Ltd.

Panasonic Corporation

Hitachi High-Tech Science Corporation

Etsuyoshi Sakaguchi

Kiyoshi Hasegawa

Hiroshi Iwamoto

Yoshiyuki Tani

Takao Hisazumi

Yukihiro Iwata

Yutaka Nio

Hidemi Henmi

Atsushi Ishizu

Satoru Inagaki

Tetsuji Maeda

Kenjirou Tsuda

Shuuhei Taniguchi

Hideki Inoue

In a fluorescent X-ray analysis method, a sample () is set on a sample stage () on an upper side of an X-ray irradiation chamber () and a sample cover () is closed from the upper part of the sample () to surround the sample (), and then, a lower plane of the sample () is irradiated with X-ray for analysis. When the sample () is set on the sample stage () and the sample cover () is closed, a cover detecting means () detects that the sample cover () is closed and X-ray is automatically projected from an X-ray source () to start analysis.

Fluorescent X-ray analysis method and device

It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.

Fluorescent x-ray analysis method and fluorescent x-ray analysis device

The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.

Fluorescent X-ray analysis method and fluorescent X-ray analysis apparatus

A broadcasting reception apparatus includes a display unit for presenting a display showing a plurality of channels, with which the user can recognize whether decoding software programs for decoding program signals being currently broadcast via each channel are held in a library buffer, or not, thereby making possible pleasant zapping.

Broadcasting reception apparatus and data broadcasting method

Comprising memory means for recording contents of a program and service additional information containing information relating to a program received in an information receiving apparatus, means for reserving to record a program on the basis of service additional information, means for detecting overlapping of recording time of programs, selecting means for comparing service additional information of programs overlapped in recording time, and selecting a program preferable for the user, means for changing record reservation of program on the basis of the result of selection, viewing trend survey means for investigating the viewing trend of the user, and reproducing means, a program preferable for the user is automatically reserved for recording according to service additional information, or a preferred program out of overlapped programs is automatically selected and recorded in the case of change in broadcasting time.

Information receiving system and method

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Osaka, Japan

Etsuyoshi Sakaguchi