Hamamatsu-photonics K.k.

Etsuo Iizuka

Akio Suzuki

Motohiro Suyama

Masahiro Hayashi

Katsutoshi Nonaka

Yuuya Washiyama

Hiroshi Kobayashi

Akihiro Kageyama

Toshiyuki Uchiyama

An MCP has a rectangular plate shape and has a porous part, to which a plurality of pores (channels) penetrating in the thickness direction are disposed, and a poreless part including a solid glass or the like to which the channels are not provided on the both sides of the porous part. Then, on both surfaces of the MCP, an input side electrode and an output side electrode are respectively formed so as to cover the poreless parts on the both surfaces while sandwiching the porous part.

Micro channel plate

A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tubewhere ions fly is arranged in a vacuum vessel composed of a vacuum flangeand a body, and an MCP groupis attached to a tail end of the flight tubevia an MCP-IN electrode. A vacuum flangeis attachably and detachably attached to the body, and the MCP group, by a springprovided on a circuit boardfor detection attached to the vacuum flange, is urged toward an end portion of the flight tubeso that its orthogonality with respect to an ion flight track is secured.

Mass spectrometer

In a charged particle detecting apparatusfor which an MCP is sandwiched with an IN electrodeand an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrodeare arranged further inside than the IN electrodewhen viewed from an MCP incident surface, and the charged particle detecting apparatusis fixed by screwing and the like to a cabinet wall surfaceof a TOF-MS by using a flange portion provided at a part of IN electrodeprojected further outside than the rear component members.

Time of flight mass spectrometer and charged particle detector therefor

An electron multiplier that can easily obtain characteristics according to a purpose is provided. By bonding a marginal portionof an MCPand a marginal portionof an MCPto each other via a conductive spacer layer, a gapis formed between channel portions. Therefore, when the electron multiplier is used for a purpose that requires a particularly high gain, by adjusting the thickness of the spacer layer, the gain can be increased by increasing the gap. In addition, when the electron multiplier is used for a purpose that requires an increase in gain as well as time characteristics, by adjusting the thickness of the spacer layer, the size of the gapcan be adjusted so that desired characteristics are obtained. Consequently, by only adjusting the thickness of the spacer layer, characteristics according to the purpose can be easily obtained.

Electron multipler and electron detector

In an MCP assemblyhaving one or a plurality of MCPssandwiched with an input-side electrodeand an output-side electrode, there provided at the surface facing the MCPof at least either (preferably, both) of the input-side electrodeand the output-side electrode, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.

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Hamamatsu, Japan

Etsuo Iizuka