Amazon Technologies, Inc.

Etai Wagner

Dan Trock

Yuri Geogdjaev

Victor David Romanov

Ilan Shusterman

Alon Postavski

Lev Makovsky

A voltage droop detection circuit can be used to detect a voltage droop in an integrated circuit (IC) device. The voltage droop detection circuit may include a chain of inverting stages, and each inverting stage may include a P-type transistor and an N-type transistor. The chain of inverting stages can be initialized to alternating logic states during an initialization phase of a clock cycle, and an evaluation pulse can be inputted into the chain of inverting stages during an evaluation phase of the clock cycle. A voltage droop may be detected if a number of inverting stages that are able to switch output logic states from their respective initialized logic states is smaller than a nominal value indicating a number of inverting stages that are able to switch their respective output logic states under normal voltage condition.

Voltage droop detection using inverting stages

An integrated circuit device may include core circuitry, and a set of external interface buffer circuits coupled to the core circuitry. To improve test time and accuracy, as well as to simplify test procedures during voltage testing of the set of external interface buffer circuits, the integrated circuit device may include a test circuit and a combinational logic circuit coupled to the set of external interface buffer circuits. The combinational logic circuit is configured to combine a logic level of each of the external interface buffer circuits into a test signal, and the test circuit is configured to execute a voltage test on the set of external interface buffer circuits based on a logic level of the test signal.

Input/output voltage testing with boundary scan bypass

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Haifa, Israel

Etai Wagner