Texas Instruments Corporation

Nxp Usa, Inc.

Estelle Nguyen

Lorenzo Carpineto

Angel Ezquerra-Moreu

Jerome Mallet

Christophe Athanassiou

An integrated circuit and a method of performing a built-in-self-test (BIST) procedure in an integrated circuit. The integrated circuit includes a plurality of radio circuits and a switching network for performing a built-in-self-test (BIST) procedure. The switching network includes a plurality of combiners, a plurality of transmitter connection switches, a combiner switch, a splitter switch, a plurality of splitters and a plurality of receiver connection switches. The switching network may also include a splitter bypass switch and/or a combiner bypass switch. The components of the switching network may operate to route signals between outputs and inputs of the radio circuit to implement the built-in-self-test procedure in one or more modes involving either parallel or sequential testing of the components of the radio circuits. A diagnostic mode is also envisaged.

Integrated circuit and method of performing a BIST procedure

A gain control system in a Direct Conversion Receiver or similar receiver, includes an automatic gain control circuit which determines whether a low noise amplifier, which amplifies signals from an antenna prior to mixing with signals from a local oscillator, should be set to a high gain or a low gain. The output of the mixer is analyzed by a blocker detect circuit to determine whether a blocker signal is present. Based on the presence of a blocker signal and the power level of the useful signal, the gain of the low noise amplifier may be reduced from the high gain to an intermediate gain in order to reduce self mixing between the radio frequency and local oscillator ports of the mixer, which may lead to dynamic DC offsets.

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Antibes, France

Estelle Nguyen