Synopsys, Inc.

Esha Dutta

Bhaskar Pal

Rajarshi Mukherjee

Parijat Biswas

Sauresh Bhowmick

Pravash Chandra Dash

Danish Jawed

Harsha Vardhan

Sharad Gaur

A system and method generates cluster-based power architecture interfaces for an integrated circuit (IC) design under test (DUT) debugging by receiving design data for an IC DUT, determining power characteristic data for the IC DUT, generating display components within a graphical user interface (GUI) corresponding to individual components encompassed within a power intent hierarchy corresponding with the IC DUT, generating graphical links between displayed components, overlaying interactive elements corresponding with generated violation clusters over graphical links, and providing root-cause interactive elements within the generated GUI having visual associations with the interactive components corresponding with particular violation clusters.

System and method for generating a cluster-based power architecture user interface

A data analysis engine is implemented in a testbench to improve coverage convergence during simulation of a device-under-validation (DUV). During a first simulation phase initial stimulus data is generated according to initial random variables based on user-provided constraint parameters. The data analysis engine then uses a time-based technique to match coverage variables sampled from simulation response data with corresponding initial random variables, determines a functional dependency (relationship) between the sampled coverage variables and corresponding initial random variables, then automatically generates revised constraint parameters based on the functional dependency. The revised constraint parameters are then used during a second simulation phase to generate focused random variables used to stimulate the DUV to reach additional coverage variables. In one embodiment, the functional dependency is determined by cross-correlating sampled coverage variables and corresponding initial random variables.

Automated coverage convergence by correlating random variables with coverage variables sampled from simulation result data

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Bengaluru, India

Esha Dutta