Paul Scherrer Institut

International Business Machines Corporation

Ernst Meyer

Thomas A Jung

Bettina Baumeister

Michel Despont

Peter Vettiger

Christoph E Gerber

Laura Heyderman

Christoph Walter

Roland Bennewitz

The invention is essentially characterized in that in a first step a substrate is provided, which is coated with defined pattern of protrusions of a coating layer of a different material, so that an interface is defined between the substrate and the coating layer. As an example, the patterned coating layer can be applied by first forming an essentially homogeneous coating layer, which is then partially removed by means of photolithographic and etching techniques, leaving nanometer sized protrusions in that layer. As a next step, the surface provided with these structures is modified by selectively removing protrusions by means of a micro-device. Such a micro-device can be formed in a similar way to a scanning probe microscope (SPM) tip. The presence or absence of a protrusion represents a readable data bit information.

Memory element, method for structuring a surface, and storage device

An investigation device includes a time of flight mass spectrometer with an entrance opening, and an electrically conductive tip on a cantilever which is movable from a first position near a sample on a sample holder to a second position near the entrance opening. A sample particle is obtained with the tip being in the first position from the sample. The tip, with the particle, is moved into the second position where the particle can be accelerated towards the entrance opening. The particle is analyzable by the time of flight mass spectrometer.

Investigation device and method

Growing community of inventors

Muttenz, Switzerland

Ernst Meyer