The 41st Parameter, Inc.

Ernest Mugambi

Raz Yalov

Systems and methods for determining uniqueness of device identifiers are provided. The uniqueness of a device identifier may be indicated by a device quality score or grade that is calculated based on a plurality of parameters associated with a device identifier as well as evaluation rules derived based on historical data. The plurality of parameters may be associated with a network event or transaction associated with the device identifier. The evaluation rules may be derived using machine learning techniques. Based on uniqueness of a device identifier, a suitable action or measure may be taken.

System and method for device identification and uniqueness

Systems and methods for determining uniqueness of device identifiers are provided are provided. The uniqueness of a device identifier may be indicated by a device quality score or grade that is calculated based on a plurality of parameters associated with a device identifier as well as evaluation rules derived based on historical data. The plurality of parameters may be associated with a network event or transaction associated with the device identifier. The evaluation rules may be derived using machine learning techniques. Based on uniqueness of a device identifier, a suitable action or measure may be taken.

Growing community of inventors

San Jose, CA, United States of America

Ernest Mugambi