Rensselaer Polytechnic Institute

Ge Healthcare Finland Oy

Erkki Somersalo

David Isaacson

Samuli Siltanen

Matti Lassas

Margaret Cheney

Jari Kaipio

Ville Kolehmainen

Eli L Isaacson

The invention relates to a medical X-ray devicearrangement for producing three-dimensional information of an objectin a medical X-ray imaging medical X-ray device arrangement comprising an X-ray sourcefor X-radiating the object from different directions and a detectorfor detecting the X-radiation to form projection data of the object. The medical X-ray devicearrangement comprises: to produce three-dimensional information of the object, the prior distribution p(x) representing mathematical modelling of the object, the object image vector x, which comprise values of the X-ray attenuation coefficient inside the object, m representing projection data, the likelihood distribution p(m|x) representing the X-radiation attenuation model between the object image vector x and projection data m, p(m) being a normalization constant and the posteriori distribution p(x|m) representing the three-dimensional information of the object

Method and arrangement for medical X-ray imaging and reconstruction from sparse data

A method for the impedance imaging of a three-dimensional body utilizes electrtodes on the outer surface of the body which receive a set of current patterns. The resulting voltage patterns are measured at the outer boundary of the body. Synthesized resulting patterns are then calculated for inner boundaries of the body, each at a selected incremental distance inwardly of the outer boundary. The synthesis step is repeated for successive inner boundaries until the center of the body is reached. The measured and synthesized patterns are utilized to calculate or otherwise find various medium properties in the body, such as the electric conductivity and electric permittivity for the body. These impedance characteristics based on the measured and synthesized patterns are used to produce an image of the body.

Layer stripping process for impedance imaging

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Helsinki, Finland

Erkki Somersalo