Micron Technology Incorporated

Erik V Pohlmann

Won Ho Choi

Neal J Koyle

Scott Schlachter

Methods, systems, and devices for maximum memory clock estimation procedures are described. For instance, a device, such as a host device, may truncate a value of a first parameter associated with a first duration for a clock coupled with a memory array to perform a clock cycle and may estimate a value of a second parameter that is inversely proportional to the truncated value of the first parameter. The device may determine a quantity of clock cycles associated with a maximum duration for accessing one or more memory cells of the memory array based on adjusting the second parameter. The device may access the one or more memory cells of the memory array based on the determined quantity of clock cycles associated with the maximum duration.

Maximum memory clock estimation procedures

Methods, systems, and devices for initializing memory systems are described. A memory system may transmit, to a host system over a first channel, signaling indicative of a first set of values for a set of parameters associated with communicating information over a second channel between a storage device of the memory system and a memory device of the memory system. The host system may transmit, to the memory system, additional signaling associated with the first set of values for the set of parameters. For instance, the host system may transmit a second set of values for the set of parameters, an acknowledgement to use the first set of values, or a command to perform a training operation on the second channel to identify a second set of values for the set of parameters. The memory system may communicate the information over the second channel based on the additional signaling.

Initializing memory systems

Methods, systems, and devices for dynamic random access memory speed bin compatibility are described. For instance, a device (e.g., a memory device, a host device) may combine a first parameter with a second parameter to generate a third parameter, where the first parameter may be associated with a duration for a clock that is coupled with a memory array to perform a clock cycle and the second parameter may be associated with a timing constraint associated with initiating an access operation for the memory array. The device may determine a latency of a column address strobe based on the third parameter relative to (e.g., satisfying) a threshold value and may access one or more memory cells of the memory array based on the latency of the column address strobe.

Dynamic random access memory speed bin compatibility

Methods, systems, and devices for memory clock management and estimation procedures are described. A host device may determine a quantity of clock cycles associated with a duration for accessing a memory cell of a memory array based on truncating a value of a first parameter associated with another duration for a clock to perform a clock cycle. The host device may estimate a value of a second parameter related to (e.g., inversely proportional) to the truncated value of the first parameter and related to (e.g., directly proportional) to a correction factor, and may adjust (e.g., truncate) a third parameter to determine the quantity of clock cycles. Additionally or alternatively, the host device may adjust (e.g., perform a ceiling operation on) the second parameter to determine the quantity of clock cycles. The host device may access the memory cell based on the quantity of clock cycles.

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Boise, ID, United States of America

Erik V Pohlmann