Alcatel N.v.

Erik Moerman

Didier Rene Haspeslagh

Daniel Frans Van De Pol

Johannes Anthonius Van Tetering

Johan David

To test the processing of a data frame processing unit (FPU) which, in a normal working mode, processes input data frames applied to a data frame input (FI) thereof, the data frame processing unit (FPU) is brought in a test mode. Therefore, an active test signal is applied to a test mode control input (TCI) of this data frame processing unit (FPU). When brought in the test mode, the frame counters of the data frame processing unit (FPU) have lower limits and test data frames with smaller dimensions than the input data frames applied to the data frame input (FI).

Frame processing unit with test mode, line termination module including

In a digital sigma-delta modulator with multi-phase operations by time-sharing including an adder to produce multiple integration, an arrangement includes switching circuitry for alternately establishing one of: a connection between a first input of the adder and an input of the modulator; and connections between the adder output and the first input of the adder by way of a first integration delay circuit, and the adder output and a second input of the adder by way of a second delay circuit.

Growing community of inventors

Bottelare, Belgium

Erik Moerman