Carl Zeiss X-Ray Microscopy, Inc.

Xnovo Technology Aps

Danmarks Tekniske Universitet

Danmarks Tekniske Universitet of Anker Engelundsvej

Danmarks Tekniske Universitet Anker Engelundsvej

Erik Mejdal Lauridsen

Henning Friis Poulsen

Michael Feser

Peter Reischig

Christian Holzner

Christian Wejdemann

Stefan Othmar Poulsen

Péter Reischig

Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

X-ray multigrain crystallography

Disclosed is method of determining one or more unit cells of a polycrystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.

A method and system for three dimensional crystallographic grain orientation mapping illuminates a polycrystalline sample with a broadband x-ray beam derived from a laboratory x-ray source, detects, on one or more x-ray detectors, diffracted beams from the sample, and processes data from said diffracted beams with the sample in different rotation positions to generate three dimensional reconstructions of grain orientation, position, and/or 3-D volume. A specific, cone beam, geometry leverages the fact that for a point x-ray source with a divergent beam on reflection of an extended crystal grain diffracts x-rays such that they are focused in the diffraction plane direction.

Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities

An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.

X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.

Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities

An X-ray diffraction contrast tomography system (DCT) comprising a laboratory X-ray source (), a staging device () rotating a polycrystalline material sample in the direct path of the X-ray beam, a first X-ray detector () detecting the direct X-ray beam being transmitted through the crystalline material sample, a second X-ray detector () positioned between the staging device and the first X-ray detector for detecting diffracted X-ray beams, and a processing device () for analysing detected values. The crystallographic grain orientation of the individual grain in the polycrystalline sample is determined based on the two-dimensional position of extinction spots and the associated angular position of the sample for a set of extinction spots pertaining to the individual grain.

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Harlev, Denmark

Erik Mejdal Lauridsen