United Technologies Corporation

Raytheon Technologies Corporation

Erik M Pedersen

Joseph D Drescher

Jesse R Boyer

Brian Duguay

Robert E Erickson

Edward Marchitto

Thomas Balzano

Kamiko L Darrow

Danielle N Balzano

Brian Ricciardelli

A method is provided for inspecting a device comprising a plurality of bristles. During this method, image data provided from an electronic optical sensor is received. The image data is indicative of an image of at least a portion of the bristles. A bristle configuration (e.g., an angle) of at least one of the bristles (e.g., an average bristle) in the image is determined by processing the image data with a computer processor.

Systems and methods for inspecting bristles using a digital camera

An optical height gauge including a housing, a mounting bar coupled to, and maintained partially in, the housing, a mounting bracket connected to the mounting bar, the mounting bracket including at least one light source holder, a camera mount connected to the mounting bracket, and a tilt bar connected to the mounting bracket and contacting the mounting bar.

Precision optical height gauge

Inspecting features of an object including measuring features of the master part that represents a desired nominal dimensions to obtain a preliminary set of dimensional data. The preliminary set of data becomes a master data set. The same master part is measured on a second machine to obtain another set of data on the master part. The two data sets are compared and correction data is generated representing differences between the different data sets for the same master part measured on different machines. Subsequent parts are then measured on the second machine to obtain measurement data that is corrected based on the correction data. The application of the correction information provides for the use of 5-axis machines within a desired measurement capability.

Accurate machine tool inspection of turbine airfoil

A laser alignment system may comprise a machine, a laser source attached to the machine, a photodiode able to communicate with the laser source, and a receiver including the photodiode, wherein a signal is generated upon communication between the photodiode and the laser source.

Laser alignment system

A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.

Machine tool&#x2014;based, optical coordinate measuring machine calibration device

A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

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Cheshire, CT, United States of America

Erik M Pedersen