Sri International

Erik Frank Matlin

Robert A Brown

Richard A Hill

Sek Meng Chai

David Chao Zhang

David S Stoker

Zachary Flom

Karen Marie Nashold

Motilal Agrawal

Neil William Troy

James R Potthast

In general, techniques are described for processing a set of high-resolution images of an integrated circuit, the images captured at different locations with respect to the integrated circuit, to automatically align and 'stitch' the set of high-resolution images into a larger composite image. For example, an imaging system as described herein may use sampled feature points distributed across different grid tiles within overlap regions for pairs of images to match feature points to inform the alignments of a pair with respect to each image in the pair. The system may in some cases further apply a bundle adjustment to iteratively align and refine the alignment results for each image in a set of images being processed. In some examples, the bundle adjustment is a best-fit adjustment based on minimizing the net error associated with the alignment of the set of images.

Integrated circuit image alignment and stitching

A system, method, and apparatus are discussed for a passive optical camera-based system to detect a presence of one or more vehicles with one or more cameras. A detection algorithm is applied to recognize of the presence of the one or more vehicles using one or more imaging processors and the one or more cameras to detect fluctuations in light intensity from scattered light and/or reflections off of that vehicle. Those scattered light and/or reflections are captured in images contained in a set of frames from the one or more cameras.

Passive optical detection method and system for vehicles

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.

Method and apparatus for conducting automated integrated circuit analysis

Growing community of inventors

Los Gatos, CA, United States of America

Erik Frank Matlin