Dow Global Technolgoies LLC

Rohm and Haas Company

Erick Sutanto

Donald L McCarty, Ii

Brayden E Glad

Hitendra Singh

John Lund

Larry Dotson

Donald L Ii Mccarty

A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.

System for analyzing impact and puncture resistance

A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.

Device for analyzing impact and puncture resistance

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Collegeville, PA, United States of America

Erick Sutanto