Ernst Leitz Wetzlar Gmbh

Erich Schuster

Hans-Dieter Jacoby

Rainer Fritsche

Wolfgang Ferber

Jorg Willhelm

Manfred Kartzow

Herbert Hahn

Karl-Wilhelm Schenck

Dieter Prinz

Gunthard Nissel

Richard Jung

Device for automatically determining the deviation between the

Method and arrangement for aligning, examining and/or measuring

A mount on the probe head of a coordinate measuring machine is described. For rapid change of a probe pin carrier, accommodating at least one probe pin, which is drawn against a bearing which clearly determines the position of the probe pin carrier in the probe head, a mechanical clamp mechanism, which acts on the bearing part of the probe pin carrier, and compression-creating and tension-creating media, actuating the clamp mechanism, are provided in the probe head.

Rapid change holder for probe pins

Apparatus for sensing test values at test samples which uses an elastically supported mechanical sensor (3) moving relative to test samples (4) and at least one test value transmitter (11) with counter (9) detecting the relative motion between the sensor (3) and the test samples. At the instant of impact between sensor (3) and the test samples (4), a signal is generated which is used to store the test value present at the test value transmitter (11) at the instant of impact between the sensor (3) and the test samples (4) into a memory (13a,13b). The sensor consists of one part (2') which is fixed to the housing and other part (2') which is movable with respect to the fixed one. An oscillation or acceleration pickup (10) is mounted externally to the moving part (3) and generates the signal required to store the test value. A circuit (14) is provided to the oscillation or acceleration pickup (10) to distinguish between actual sensing signals and spurious ones. This circuit (14) selects any spurious signals from the sensed (test) signal and controls the data flow between the memory (13a,13b) and a subsequent computer (16) for analyzing the test signals.

Apparatus for sensing test values at test samples

Instrumentation for sensing the test values at test samples, using a mechanical sensor moving relative to the test sample and consisting of a housing fixed part and of a movable, articulating multi ball and socket part connected to the housing fixed part and at least one test value transmitter. A trigger signal is generated in the instrumentation at the instant of impact between sensor and test sample and is stored to record the test value present at the time of impact at the test value transmitter. At least one force or acceleration pickup (12,23,24,30) is provided which is mounted on the housing fixed part (2) of the sensor (5) and delivers the trigger signal.

Instrumentation for sensing the test values at test samples

Disclosed is a linear micrometer which comprises a cylindrically shaped housing, a tube-shaped sleeve displaceably mounted along the longitudinal axis of the housing and extending from one end of the housing, a measurement scale fixedly mounted along the longitudinal axis of the housing and slidingly supported inside the spindle sleeve, and a measurement readout means couple to the spindle sleeve for reading and displaying the relative position of the spindle sleeve to the scale. A rapid adjusting means and fine adjusting means are also provided.

Linear micrometer

Disclosed is a two-coordinate measuring device for use in the measuring ocular of a microscopic measuring instrument, comprising at least one reference mark carrier movably mounted in an intermediate image plane of the instrument and having a direction of movement which forms an angle of 45.degree. with axes in the x- and y-direction defined by the object, and means mounted in the measuring ocular for adjusting the position of the mark carrier in order to align the reference mark with the dimensions of an object which is to be measured. The reference mark of the carrier preferably comprises two perpendicular lines which are arranged on the carrier such that the bisector of the angle formed by the lines coincides with the direction of movement of the carrier. Also disclosed is a process for use of this device.

Growing community of inventors

Huttenberg, Germany

Erich Schuster