Textron Systems Corporation

Erich R Gross

Anthony S Lee

David M Mayes

Anthony K Maczura

The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.

Optical probes and methods for spectral analysis

Percentage concentrations of constituents or color components of a sample are determined using a spectral analyzer with a wide illumination spot size and detector. The analyzer irradiates the sample, picks up diffuse reflectance of individual wavelengths from the sample and spatially separates the diffuse reflectance into a response at individual wavelengths. The result is to simultaneously detect the intensities of the individual wavelengths in parallel from the sample being analyzed. Percentage constituents of a composite substance can be determined or, alternatively, the components of color in a sample can be determined by analyzing wavelengths of reflected light.

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Rohnert Park, CA, United States of America

Erich R Gross