Tec-sem Ag

Erich Jäger

Christian Balg

A storage apparatus for objects in the manufacture of substrates, in particular of substrates for electronic components, is provided with a housing which forms at least one closed area for storage of the objects. The storage apparatus also has a pure air device by which a pure air atmosphere can be produced at least within a section of the housing. Using at least one input/output device for the storage apparatus, objects can be passed into the interior of the housing or removed from the interior, in which case the objects can be handled by at least one handling device in the interior of the housing, and object receptacles are provided within the housing, in which objects can be temporarily stored outside transport containers. In order to require a position area which is as small as possible for a storage apparatus such as this, despite it having a high storage capacity, the invention provides that two areas which are arranged at least partially one above the other are formed in the same housing of the storage apparatus, with a first area for an object storage device, and a second area for a transport container storage device.

Apparatus for storage of objects from the field of manufacture of electronic components

The invention relates to a device for storing platelike substrates, particularly wafers or test wafers, like those, in particular, used for manufacturing electronic components. The aim of the invention is to make a reliable access to the substrates possible even when storage elements, which can be separated from one another, of the device are affected by manufacturing mistakes. For such a device that, for each substrate, has a number of storage elements, which follow one another in a direction of stacking and which can move relative to one another, in which the storage elements have a stacking area, which is provided for placing the respective storage element inside a stack of storage elements, compensating means are therefore provided in order to compensate for stacking errors in the direction of stacking.

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Frauenfeld, Switzerland

Erich Jäger