Siemens Aktiengesellschaft

Erich Becker

Klaus Ludwig

Gabriel M Daalmans

Hans-Peter Lohmann

Ludwig B&auml;r

A scanning head for eddy-current testing includes a probe coil configuration disposed on a film on a film base. The film base is matched to a shape of an object to be tested. This allows quick, low-interference eddy-current testing. A method for producing a scanning head for an eddy-current test and an eddy-current test method are also provided.

Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method

The invention relates to a method according to the eddy-current testing principle, and to a device for determining the thickness of an electrically conductive protective layer which is applied to an electrically conductive base material. The electrical conductivities of the protective layer and of the base material are different from each other. An excitation coil through which a high-frequency electric current is passed is brought near to the protective layer, so that an electric eddy current is produced in the protective layer and possibly in the underlying base material. A parameter related to the impedance of a probe coil is determined and is used as a basis for determining the thickness of the protective layer, for example by comparison with known reference values. The frequency of the high-frequency electric current is selected in such a way that the thickness of the protective layer is determined unambiguously for a ratio of the electrical conductivities of between 0.7 and 1.5.

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Marl, Germany

Erich Becker