Etaluma Inc.

Eric Weiner

Robert K Levin

Chris Shumate

Microscope imaging and illumination systems and methods are included that may be used to image multiple specimens at different locations relative to a specimen fixture without the need for repositioning a source of illumination. In some cases, light patterns emitted from illumination screens may be repositioned and reconfigured electronically as needed with an illumination signal communicated to such illumination screens. Specialized microscope imaging techniques such as phase contrast microscopy may also be used with the systems and methods discussed herein.

Growing community of inventors

San Diego, CA, United States of America

Eric Weiner