Kingtiger Technology (canada) Inc.

Eric Sin Kwok Chiu

Sunny Lai-Ming Chang

Bosco Chun Sang Lai

Lawrence Wai Cheung Ho

Lei Zhang

Arthur Yu Kuen Lam

Xiaoyi Cao

Shaodong Zhou

Simon Shu Man Choi

Systems and methods are provided for testing a Device Under Test (DUT) in its working environment. A control computer is coupled to an air compressor and generates a temperature control signal that is provided to the air compressor to generate an amount of hot air or cold air to set the temperature of the DUT's working environment to a desired test temperature. The control computer also generates at least one test signal that is sent to a hardware test element for testing at least one memory component of the DUT at the desired test temperature and obtaining test results. The control computer analyzes the test results to determine a parameter adjustment for the at least one memory element so that it operates in a stable manner at the test temperature.

System and method for verifying and analyzing memory for high performance computing systems

Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises: assembling a memory module, the memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module, wherein the memory module comprises a microprocessor and persistent memory associated with the microprocessor, and wherein the persistent store on the memory module comprises the persistent memory associated with the microprocessor.

Systems and methods for testing and assembling memory modules

Embodiments of systems and methods for testing memory are disclosed, where memory errors are detected, and, in at least one embodiment, memory units containing errors are prevented from being accessed by applications on a computing system.

Systems and methods for testing memory

Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises, for each memory device of a plurality of memory devices, based on testing performed on the memory device, determining whether the memory device has any defective memory locations, and if so, identifying the one or more defective memory locations, and generating data that identifies the one or more defective memory locations on the memory device; and assembling a memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises, for each memory device of the memory module having one or more defective memory locations, storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module.

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Mississauga, Canada

Eric Sin Kwok Chiu