General Electric Company

Eric Seth Moderbacher

Alberto Santamaria-Pang

Patrick Joseph Howard

Yousef Ahmed Al-Kofahi

Bruce Courtney Amm

Michael J MacDonald

Aritra Chowdhury

Shourya Sarcar

Peter Arjan Wassenaar

An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.

Systems and methods for automatic defect recognition

Growing community of inventors

San Diego, CA, United States of America

Eric Seth Moderbacher