Micron Technology Incorporated

Eric Nien-Heng Lee

Koichi Kawai

Sundararajan Sankaranarayanan

Akira Goda

A device includes an array of memory cells with a first word line coupled to at least a subset of the array of memory cells and control logic coupled to the first word line. The control logic to detect, within a queue, a first read command to read first data from a first page of the subset and a second read command to read second data from a second page of the subset. The control logic is further to cause a voltage applied to the first word line to move to a target value. The control logic is further to cause a page buffer to sense the first data from a first bit line coupled to the first page and to sense the second data from a second bit line coupled to the second page. The control logic is further to cause the first word line to be discharged.

Read-time overhead and power optimizations with command queues in memory device

A device includes an array of memory cells having a word line coupled to at least a subset of the array, a queue, and control logic. The control logic: detects a first read command to read first data from a first page of the subset; accesses a second read command in the queue, the second read command to read second data from a second page of the subset; causes a voltage applied to the word line to ramp up to an initial value; causes the voltage to move to a target value; directs a page buffer to sense the first data from a first bit line coupled to the first page of the subset; directs the page buffer to sense the second data from a second bit line coupled to the second page of the subset; and causes the word line to be discharged.

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San Jose, CA, United States of America

Eric Nien-Heng Lee