Howmedica Osteonics Corporation

The University of Liverpool

Benoist Girard Sas

The Chancellor, Masters and Scholars of the University of Cambridge

Stryker European Operations Holdings LLC

Eric Jones

Christopher John Sutcliffe

Robin Stamp

William O'Neill

Lewis Mullen

Nicholas Nai Guang Dong

Dan Jones

Aiguo Wang

Matthew P Poggie

Robert W Klein

Joe Robinson

Joseph Robinson

Hay Wong

Daniel E Lawrynowicz

Casper F Stark

John H Dumbleton

Gregory Plaskon

Martin Sparkes

Rebecca Helen Garrard

Ruey Lin

Jonathon Parkins

Patrick Raugel

Neil Rushton

Richard Eddy Field

William O`neill

Christopher J University Of Liverpool Sutcliffe

Aspects of the present disclosure relate generally to preparing models of three-dimensional structures. In particular, a model of a three-dimensional structure constructed of porous geometries is prepared. A component file including a porous CAD volume having a boundary is prepared. A space including the porous CAD volume is populated with unit cells. The unit cells are populated with porous geometries having a plurality of struts having nodes on each end. The space is populated with at least one elongated fixation element extending beyond the boundary to produce an interlocking feature enabling assembly or engagement with a mating structure.

Surface modified unit cell lattice structures for optimized secure freeform fabrication

A method of forming an implant having a porous tissue ingrowth structure and a bearing support structure. The method includes depositing a first layer of a metal powder onto a substrate, scanning a laser beam over the powder so as to sinter the metal powder at predetermined locations, depositing at least one layer of the metal powder onto the first layer and repeating the scanning of the laser beam.

Laser-produced porous surface

The present invention disclosed a method of producing a three-dimensional porous tissue in-growth structure. The method includes the steps of depositing a first layer of metal powder and scanning the first layer of metal powder with a laser beam to form a portion of a plurality of predetermined unit cells. Depositing at least one additional layer of metal powder onto a previous layer and repeating the step of scanning a laser beam for at least one of the additional layers in order to continuing forming the predetermined unit cells. The method further includes continuing the depositing and scanning steps to form a medical implant.

Laser-produced porous structure

A High Energy Beam Processing (HEBP) system provides feedback signal monitoring and feedback control for the improvement of process repeatability and three-dimensional (3D) printed part quality. Signals reflecting process parameters and the quality of the fabricated parts are analyzed by monitoring feedback signals from artifact sources with a process controller which adjusts process parameters. In this manner, fabricated parts are produced more accurately and consistently from powder feedstock by compensating for process variation in response to feedback signals.

Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process

A component is fabricated in an additive manufacturing process. Only a portion of a first layer of a first material is at least partially melted to define a first component layer of the component. Only a portion of the second layer of a second material is at least partially melted to define a second component layer of the component in which the entirety of the second component layer is formed simultaneously, and the second component layer is attached to the first component layer.

Fabrication of components using shaped energy beam profiles

A High Energy Beam Processing (HEBP) system provides feedback signal monitoring and feedback control for the improvement of process repeatability and three-dimensional (3D) printed part quality. Electrons deflected from a substrate in the processing area impinge on a surface of a sensor. The electrons result from the deflection of an electron beam from the substrate. Either one or both of an initial profile of an electron beam and an initial location of the electron beam relative to the substrate are determined based on a feedback electron signal corresponding to the impingement of the electrons on the surface of the sensor. With an appropriate profile and location of the electron beam, the build structure is fabricated on the substrate.

System and process for in-process electron beam profile and location analyses

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Limerick, Ireland

Eric Jones